Confocal Sensor Controller for measuring rates up to 70kHz
The confocal chromatic confocalDT 2471 controllers are suitable for distance and thickness measurements of mirrored, transparent, shiny and diffuse surfaces. It is compatible with all Micro-Epsilon confocal IFS series sensors. Equipped with an external Xenon light source enables extremely fast measuring rates of up to 70kHz, making the controller ideal for high speed surface scanning and topography applications.
The high light intensity enables reliable measurements on low reflectivity surfaces, e.g. dark matt objects or for multi-layer thickness measurement of transparent surfaces. Furthermore, the excellent signal-to-noise ratio enables extremely precise measurements in the micron and sub-micron ranges
The design of the controller is ruggedised with passive cooling, ensuring the most reliable solution for both Machine and In-process applications. The Xenon light source is housed in a separated unit to avoid any thermal heating of components used for distance measurement calculations, which minimises measurement errors due to thermal drift.
In addition, the IFC2471MP (multi-peak) controller can be used for the thickness measurements of transparent, multi-layer objects for up to 6 layers. Each surface can have individual refractive index coefficients setup, enabling the controller to output the corrected thickness values.
Set up and configuration of controller and sensors is handled in a user-friendly integrated web browser. Simply connect to the controller via an Ethernet cable. Data output is via Ethernet, EtherCAT, RS422 or analogue output. High speed triggering for both leading and falling edge encoder signals is also incorporated as well as smart filtering options.
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