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Glossary - technical measuring terms basically illustrated
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G
H
I
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K
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P
Q
R
S
T
U
V
W
X
Y
Z
Absolute displacement transducer
Absorption
Accuracy
Actuator
Adjustment
Ambient light, permissible
Analogue output
Application
ASIC
ATEX
Bandwidth
Base distance
Baud rate
Cable, halogen-free
Calendering
Calibration
CANopen
Capacitive measurement principle
capaNCDT
CE directive
CENELEC
Characteristic
CMU-module
Confocal chromatic
Crosstalk
Data sheet, technical
Data transfer rate
DCAM
Device Net
Digital output
Displacement sensors
Distance Sensor
DKD
Draw-wire sensor
Eddy current
eddyNCDT
Electromagnetic compatibility (EMC)
Emissivity
Emitter
Encoder
Encoder, absolute
Encoder, incremental
EtherCAT
Ethernet
Ferro
Ferro, not
Firmware
Focus
FOV
FPA
Frequency response
Frequency spectrum
Full duplex
Grey body source
Guard electrode
Guard electrode width
Half duplex
High pressure resistant
High temperature sensor / high temperature resistant
HTL
Hysteresis
ICONNECT
IFOV
induSENSOR
Interference emission
Interference immunity
Laser protection class
Laser sensors
Laser triangulation
Light spot diameter
Linearity
Long-term stability
Lumen, unit
Lux, unit
LVDS
LVDT, Linear Variable Differential Transformer
Magnetic fields with inductive sensors
Master / slave
Measurement device
Measurement object
Measurement object diameter
Measurement range
Measuring frequency
Measuring rate
NETD
Noise
Noise, thermal
Non-linearity
Offset
Operating temperature
Optical fibre
Optical sensors
optoCONTROL
optoNCDT
OSI layer model
Poalarity reversal protection
Polling
Position sensors
Potentiometer
Process-capatibility-index
Process-capatibility-index, smallest
Profibus DP (PB)
Protection
Quantification error
Radiation
Radiation, specific
Radiation, spectral specific
Ranging sensor
Real-time
Receiver
Reference temperature
Referenzauflösung
Reflection
Reflection, diffuse
Reflection, direct
Reflection, optical
Refraction index
Repeatability
Reproducibility via temperature
Resolution
Response time
Rise time
RS232 interface
RS422
RS485
RTSC
Sampling rate
Sampling theorem
Samplingrate
scanCONTROL
SDK
Sensitivity
Sensor
Sensor measuring area, active
Shock
Short-circuit rating
Signal-to-noise ratio
Simplex
SMD
Spectral range
Spectral technology
Spring constant
SSI
Start and end of measuring range, midrange
Storage temperature
Strain Gauge
Synchronisation
Target
Telemetry
Temperature range
Temperature range, infra-red
Temperature stability
Tensile strength
thermoMETER
Tilting
Time-of-flight-principle
Transmissivity
Triggering
TTL
Vibration
wireSENSOR
X axis
Y axis
Z axis
Next exhibition:
Euro LED
(Birmingham, GB)
24.06.2013 - 25.06.2013
Sensors & Instrumentation
(Birmingham, GB)
25.09.2013 - 26.09.2013
Engineering Design Show
(Coventry, GB)
02.10.2013 - 03.10.2013
K
(Düsseldorf, DE)
16.10.2013 - 23.10.2013
SPS/IPC/Drives
(Nürnberg, DE)
26.11.2013 - 28.11.2013
Show all exhibitions
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+44 151 355 6075
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Micro-Epsilon UK Ltd
Unit 1, Pioneer Business Park North Road, Ellesmere Port Cheshire, CH65 1AD
info@micro-epsilon.co.uk
+44 151 355 6070
+44 151 355 6075