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Glossar: optoCONTROL
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optoCONTROL
optoNCDT
OSI layer model
Optical micrometers, which determine the dimension and position of the
Measurement object
in a non-contacting manner according to the principle of shadowing or light quantity measurement.
Fitting sensors and products
High resolution optical micrometer
Next exhibition:
ALUMINIUM (Essen, DE)
14.09.2010 - 16.09.2010
K 2010 (Düsseldorf, DE)
27.10.2010 - 03.11.2010
Electronica (München, DE)
09.11.2010 - 12.11.2010
Show all exhibitions
MICRO-EPSILON
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+44 151 355 6070
+44 151 355 6075
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