More precision.
 

Geometry inspection system for silicon ingots

Features

Ingot lengths up to 2500 mm
Virtual reconstruction of the surface
Can be fitted with integrated load cell
Automatic or manual marking of the defective places
Increase of the ingot yield
back to product group "Semiconductor inspection"
Contact

MICRO-EPSILON
UK & Ireland Ltd.

Phone +44 151 355 6070
Fax +44 151 355 6075
eMail Send email
Find contact personGet postal address
Mastercard and VISA accepted Express payment with
Visa or Mastercard
 
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