Precision sensor manufacturer Micro-Epsilon has extended its capaNCDT range of high precision capacitive measurement systems with a new high precision system for fast, offline thickness measurement of very thin electrically conductive film such as that used in production of batteries.
A particular challenge of measuring thin conductive films or foils, like copper and aluminium in bare and coated forms, is that it is easily torn or crumpled when handled; especially when it is ‘wafer’ thin at only around 10 micron thick. Traditional methods of measurement for quality assurance involve removing a sample from the production roll and using a contact micrometer to measure the thickness. The tight tolerances and variability from operator to operator make performing this measurement difficult.