Precise Measurement of Wafer Topography
Measuring wafer topographies requires the precise detection of even the finest height variations. The confocalLINE CLI8500 records a detailed height profile along the measurement line, from which flatness, waviness, steps, edges, or local defects can be reliably evaluated. Due to its high precision and fine height resolution, the CLI8500 is particularly well-suited for this demanding measurement task. The non-contact measurement is an additional advantage, as it prevents mechanical stress on the wafer surfaces.
Medical Technology
The CLI8500 enables non-contact measurement of stent surface contours with high detail resolution. Due to its high precision and fine height resolution, the CLI8500 is particularly well-suited for reliably inspecting dimensional accuracy, strut widths, height differences, or potential deformations. At the same time, the non-contact measurement prevents mechanical stress on the sensitive surfaces.
PIN Measurement of Micro Connectors
The CLI8500 plays a key role in the inspection of micro-connectors. The height, position, flatness and any deformation of the pins are examined on the production line. The confocal line sensor captures a precise height profile and detects deviations such as bent pins or pins that are too high or too low. Inline measurement supports reliable quality control prior to further assembly.
Indexable Cutting Inserts
Indexable inserts are replaceable cutting inserts used in machining tools for turning, milling, or drilling. To ensure reliable machining quality, cutting edges, radii, steps, clearance surfaces, and function-critical geometries must be precisely inspected. The CLI8500 captures these contours at high resolution, enabling reliable evaluation of dimensional accuracy and edge quality.
For more information on the confocalLINE CLI8500, please visit Confocal line sensor | Micro-Epsilon or call the Micro-Epsilon sales department on +44 (0)151 355 6070 or email info@~@micro-epsilon.co.uk