Research undertaken in the School of Chemistry at The University of Edinburgh is benefitting from the use of a confocal measurement system from Micro-Epsilon, which enables the optical centring of a Diamond-Anvil Cell (DAC) in X-ray diffraction…

When selecting an in-process system for measuring the thickness of film, plate or sheet materials, a number of challenges need to be considered, including sensor alignment, linearity and the effects of thermal changes, says Glenn Wedgbrow, Business…

Precision sensor manufacturer Micro-Epsilon has extended its surfaceCONTROL range of high precision 3D snapshot measurement sensors for automated, inline measurement of geometry, shape and surface quality of objects. The surfaceCONTROL 3xx0-240…